25 maggio 2013
ANDREA PADOVANI, Ph.D.
Assistant Professor of Electronics
Università di Modena e Reggio Emilia
Andrea Padovani graduated in 2005 in Electronics Engineering at the Engineering Department of the University of Modena and Reggio Emilia. In March 2009 he received the Ph.D. at the Engineering Department of the University of Ferrara, Ferrara, Italy. From September 2005 to December 2008 he collaborated with the Dipartimento di Scienze e Metodi per l?Ingegneria (DISMI), of the University of Modena and Reggio Emilia on projects concerning the experimental characterization and modelling of novel non-volatile memory devices. From January 2009 to December 2010 he was a Post-doc Fellow in the same department. He is currently an Assistant Professor at the INTERMECH Center of the University of Modena and Reggio Emilia, Reggio Emilia, Italy.
Research Interests >>> More details
His research activity focuses on the electrical characterization, physical modeling and reliability of solid-state non-volatile memory (NVM) devices and logic transistors. In the framework of NVMs, he currently works on the investigation and modeling of the physical mechanisms governing the operation and degradation of resistive memory devices (RRAM) based on transition metals oxides. In the framework of logic transistors, he work on the study and modeling of the physical mechanisms responsible for the degradation and breakdown of devices with conventional (SiON) and high-k-based (HfO2) gate dielectrics.
Publications >>> More details
He is author and co-author of more than 75 technical papers published on international journals and conferences. He serves as Committee Member of IEEE International Reliability Physics Symposium, International Symposium on VLSI Technology, Systems and Applications and IEEE International Integrated Reliability Workshop.
He is currently an IEEE member and serves as reviewer for IEEE, IOP, AIP and Elsevier international journals.
During his research activity, he has collaborated with a number of scientific and industrial institutions (in addition to several universities in Italy), including (in alphabetical order): Boise State University (Idaho, USA); CEA-LETI (Grenoble, France); GIST (Korea); IMEC (Leuven, Belgio); NTU, Nanyang Technological University (Singapore); Numonyx (Agrate, MI); SEMATECH (Texas, USA); Stanford University (California, USA).
Elettronica - © 2013 UniMoRe - XHTML | CSS -- Servizi di WEB Hosting forniti dal SI-A -